Oak Ridge National Laboratory
Oak Ridge, TN
Requisition Id 16869 Overview: We are seeking a Postdoctoral Research Associate to use advanced scanning probe microscopy for the development and application of multiscale excitonic probes. In this role, you will study buried interfaces, defects, and charge-transfer processes in vertically integrated semiconductor structures. The research will focus on low-dimensional and emerging materials incorporated into complex microelectronic and optoelectronic architectures, with particular emphasis on interfaces between two-dimensional and conventional semiconductor materials. This position resides in the Functional Atomic Force Microscopy (FAFM) group in the Nanomaterials Characterization Section, Center for Nanophase Materials Sciences (CNMS), Physical Science Directorate (PSD) at Oak Ridge National Laboratory (ORNL) and you will join our team as part of the Department of Energy's Nanoscale Science Research Center MEERCAT project. As part of our research team, you will investigate...